Our searchable equipment database is designed to provide specific information on Core Labs instruments.
Imaging and Characterization Core Lab Electron Microscope
Manufacturer: Model Number: Location: Building 3, Level 0 West
The Helios G4 is a SEM with FIB capabilities. FIB is used to modify or machine materials at the micro and nanoscale; and to deposit material such as platinum, carbon, gold, etc. via ion beam induced deposition.
The FIB is also commonly used to prepare very thin samples (typically ~100 nanometers) for the transmission electron microscope.
The Helios G4 is equipped with a cryo stage that allows examination of specimens at very low temperature ( -180 deg.C).
Manufacturer: FEI Model Number: Helios G4 UX Location: Building 3, Level 0 West
Manufacturer: FEI Model Number: 400 Location: Building 3, Level 0 West
Sample - variety of materials including biological samples (with or without sample preparations), nano-particles, powders, nano-tubes and -wires, porous materials, plastic, polymers, glass substrates, organic materials and thin films.
Manufacturer: FEI Model Number: 630 Location: Building 3, Level 0 West
Manufacturer: FEI Model Number: 600 Location: Building 3, Level 0 West
Manufacturer: FEI Model Number: Tecnai twin Location: Building 3, Level 0 West
Manufacturer: FEI Model Number: Teneo VS Location: Building 3, Level 0 West
Manufacturer: FEI Model Number: Location: Building 3, Level 0 West