Total equipment found: 18

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Freeze Dry Instrument_iac

  Preservation of biological samples structure by freeze drying.
  Sample - biologicals and thin biofilms.

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  Manufacturer:
  Model Number:
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Helios G4 UX_iac

  ​The Helios G4 is a SEM with FIB capabilities. FIB is used to modify or machine materials at the micro and nanoscale; and to deposit material such as platinum, carbon, gold, etc. via ion beam induced deposition.

  The FIB is also commonly used to prepare very thin samples (typically ~100 nanometers) for the transmission electron microscope.
  

  The Helios G4 is equipped with a cryo stage that allows examination of specimens at very low temperature ( -180 deg.C).​​​
  

  
  

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  Manufacturer: FEI
  Model Number: Helios G4 UX
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Helios_iac

  FIB is used as a micro- and nano-machining tool to modify materials at the micro and nanoscale. It can also be used to deposit material such as platinum, carbon or gold via ion beam induced deposition. The FIB is commonly used to prepare very thin samples (typically ~100 nanometers) for the transmission electron microscope. 

  a) Resolution at optimum distance: 5nm @30KV high throughput and high resolution S/TEM sample preparation - High-resolution SEM imaging and energy dispersive X-ray analysis (EDS) 

  b) Resolution at optimum distance: 0.9nm@15KV,1.4nm@1KV - Flipstage and insitu STEM detector for STEM imaging 

  c) Resolution at optimum distance: 0.8nm@30KV STEM - GIS system of deposition and enhanced milling for patterning.

  
  Sample - conductive solid materials.

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  Manufacturer:
  Model Number:
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Leica M205 FA stereomicroscope_iac

  Epifluorescence and Stereomicroscopic imaging.
  Sample - standard sample on microscope slide, transparent or non-transparent sample, with fluorescence.

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  Manufacturer:
  Model Number:
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Magellan_iac

  Scanning electron microscope - SEM - that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. This is is an ultra-high resolution field emission SEM with UniColor (UC) technology, 2-mode final lens (immersion and field-free), SE/BSE in-lens detection, a solid state concentric backscatter (CBS) detector and beam deceleration capability. Combined, these features help maximize resolution, surface detail and contrast at very low voltages. The EDS attachment allows for elemental identification/localization.
  Sample - conductive, semi-conductive and poorly conductive materials in the form of bulk, powders and thin films. These include nano-particles, nano-tubes and -wires, porous materials, plastics, polymers, glass substrates, and organic and inorganic materials.

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  Manufacturer: FEI
  Model Number: 400
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Nova Nano_iac

  Nova Nano SEM 630 is a scanning electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. This is field-emission SEM capable of ultra-high resolution characterization at high and low voltage in low and/or high vacuum environment. It is equipped with advanced optics that include a 2-mode final lens (immersion and field-free), SE/BSE in-lens detection, solid state backscatter detectors and beam deceleration technologies. Analytical capabilities are provided by EDS and EBSD from the EDAX. The instrument is also complemented by Quorum’s cryo stage and preparation chamber that allows characterization of wet biological and non-biological samples in low temperature.
  

  Sample - variety of materials including biological samples (with or without sample preparations), nano-particles, powders, nano-tubes and -wires, porous materials, plastic, polymers, glass substrates, organic materials and thin films​.​

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  Manufacturer: FEI
  Model Number: 630
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Quanta 600_iac

  Quanta 600 is a scanning electron microscope - SEM - that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. This instrument is useful for understanding the surface structure, morphology and elemental distribution of a specimen. 

  Resolution: 1.2nm for SE and 2.5nm for BSE at 30kV .

  
  Sample - a wide range of solid samples.

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  Manufacturer: FEI
  Model Number: 600
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Tecnai Twin_iac

  Transmission electron microscope - TEM - that can perform bright field (BF)/Dark field (DF) imaging of samples and electron diffraction. 
  Sample - a wide range of sample types with thickness < 200 nm in the electron beam penetrating direction. High resolution imaging of powders and bulks require very thin (50 nm) sample with high contrast at a resolution down to 1 nm.​

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  Manufacturer: FEI
  Model Number: Tecnai twin
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Teneo VS_iac

  Large volume imaging with isotropic 3D resolution enabled by a Serial Block-Face SEM (SBF-SEM) and Multi-Energy Deconvolution SEM (MED-SEM). 
  

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  Manufacturer: FEI
  Model Number: Teneo VS
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Electron Microscope
  

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  Titan Cs Image_iac

  Transmission electron microscope - TEM - capable of performing BF/DF imaging;  Cs corrected high resolution TEM imaging of samples with high contrast; high resolution TEM imaging of samples with high contrast EFTEM imaging; and electron diffraction .
  Sample - majority of TEM samples, including solids, nanoparticles, and powders with sample thickness of < 200 nm in the electron beam penetrating direction.

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  Manufacturer: FEI
  Model Number:
  Location: Building 3, Level 0 West