Equipment Database

  • Our searchable equipment database is designed to provide specific information on Core Labs instruments.

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Total equipment found: 17

  • Imaging and Characterization Core Lab
    Physical Characterization


    4 Point Probe_iac
    Thin film resistivity measurement by physically acquiring signals from the contacting pad of a semiconductor device. It utilizes manipulators which allow precise positioning of thin needles on the surface of the device. When being electrically stimulated, signals will be acquired by the probe needles and transferred to a variety of different electronic characterization equipment.
    Sample - semiconductor devices, fabricated integrated circuit chips, printed circuit boards.

    Manufacturer: Cascade Microtech
    Model Number: cps probe station
    Location: Building 3, Level 0 West

  • Imaging and Characterization Core Lab
    Physical Characterization


    Bruker D2 PHASER_iac
    X-ray Diffractometer - XRD - for phase identification at room temperature.
    Sample - powders.

    Manufacturer: Bruker
    Model Number: D2
    Location: Building 3, Level 0 West

  • Imaging and Characterization Core Lab
    Physical Characterization


    Bruker D8 ADVANCE_iac
    X-ray Diffractometer - XRD - for phase identification at room temperature.
    Sample - powders.

    Manufacturer: Bruker
    Model Number: D8 Advance
    Location: Building 3, Level 0 West

  • Imaging and Characterization Core Lab
    Physical Characterization


    Bruker D8 ADVANCE-Non-ambient_iac
    X-ray Diffractometer - XRD - for phase identification in non-ambient environment.
    Sample - powders.

    Manufacturer: Bruker
    Model Number: D8 Advance
    Location: Building 3, Level 0 West

  • Imaging and Characterization Core Lab
    Physical Characterization


    Bruker D8 DaVINCI_iac
    X-ray Diffractometer - XRD - capable of measuirng Grazing Incident Diffraction - GID - and can automatically switch between Bragg-Brantano optics and parallel optics.
    Sample - powders or thin films.

    Manufacturer: Bruker
    Model Number: D8A25
    Location: Building 3, Level 0 West

  • Imaging and Characterization Core Lab
    Physical Characterization


    Bruker D8 DISCOVER_iac
    X-ray Diffractometer for rocking curve analysis and 2 theta measurement for single crystal thin film.
    Sample - thin films.

    Manufacturer: Bruker
    Model Number: D8 Discover
    Location: Building 3, Level 0 West

  • Imaging and Characterization Core Lab
    Physical Characterization


    Bruker D8-Venture_iac
    X-ray Diffractometer for single crystal structure determination.
    Sample - single crystal.

    Manufacturer: Bruker
    Model Number: D8 Venture
    Location: Building 3, Level 0 West

  • Imaging and Characterization Core Lab
    Physical Characterization


    Horiba Aramis_iac
    Raman ​spectrometer capable of the following: a) Raman spectral acquisition 2D Raman image mapping at room temperature; b) micro-Raman spectral acquisition 2D Raman image mapping lat ow (77 K) temperature; and c) Raman spectral acquisition at high (873 K) temperature. This instrument is equipped with 325nm, 473nm, 633nm, and 785nm lasers.
    Sample - a) powders, liquids, pellets for thin films for RT Raman/PL; b) pellets or thin films with dimension less than 1cm × 1cm for temperature dependent Raman/PL.

    Manufacturer: Horiba Jobin Yvon
    Model Number: Aramis
    Location: Building 3, Level 0 West

  • Imaging and Characterization Core Lab
    Physical Characterization


    Horiba LabRAM HR_iac
    High resolution Raman spectrometer capable of the following a) Raman spectral acquisition 2D Raman image mapping at room temperature; b) micro-Raman spectral acquisition 2D Raman image mapping at low (77 K) temperature; c) Raman spectral acquisition at high (873 K) temperature. This instrument is equipped with 473nm, 532nm, 633nm, and 785nm lasers.
    Sample - a) powders, liquids, pellets, thin filmsfor RT Raman/PL; b) pellets and thin films with dimension less than 1cm × 1cm for temperature dependent Raman/PL.

    Manufacturer: Horiba Jobin Yvon
    Model Number: HR 800
    Location: Building 3, Level 0 West

  • Imaging and Characterization Core Lab
    Physical Characterization


    Oxford single crystal diffractometer_iac
    X-ray Diffractometer - XRD - capable of determining single crystal structure. 
    Sample - single crystal.

    Manufacturer: Oxford Diffraction
    Model Number:
    Location: Building 3, Level 0 West