Total equipment found: 11

• Imaging and Characterization Core Lab
  Surface Science
  

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  Agilent 5400 SPM - 1_iac

  Scanning Probe Microscope - SPM - capable of measuring the following characteristics of surface sample: a) 3D topography; b) surface roughness; c) magnetic and electrical properties; d) topography imaging mode (atmospheric/liquid environment) - 3D image; and e) step height. It can also perform Lateral Force Microscopy - LFM -to measure the frictional properties; and Magnetic Force Microscopy - MFM - to map magnetic domain.
  Sample - thin films, nanoparticles and nanowires with maximum structure height of 8 µm. Nanoparticles and nanowires have to be fixed on flat substrate. 

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  Manufacturer: Agilent Technologies
  Model Number: Agilent 5400 SPM
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Surface Science
  

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  Agilent 5500 SPM_iac

  Scanning Probe Microscope - SPM - capable of measuring the following characteristics of sample surface: a) 3D topography, to measure roughness and step height; b) Lateral Force Microscopy - LFM - to measure frictional properties; c) Magnetic Force Microscopy - MFM - to map magnetic domain; d) current sensing Atomic Force Microscopy - AFM - to measure conductivity distribution; e) IV curve; f) Electrostatic Force Microscopy - EFM - to qualitatively measure local static charge domain and charge carrier density; g) Kelvin Force Microscopy - KFM - to quantitatively measure surface potential; h) Piezoresponse Force Microscopy - PFM - to measure electromechanical properties of piezoelectric and ferroelectric materials; i) Force Spectroscopy, to measure polarity and strength of the interaction between AFM tip and sample; j) Scanning Tunneling Microscopy - STM - to measure topography using tunneling current.
  Sample - thin films, nanoparticles and nanowire with maximum structure height of 8 µm. Nanoparticles and nanowires have to be fixed on flat substrate. .

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  Manufacturer: Agilent Technologies
  Model Number: Agilent 5500 SPM
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Surface Science
  

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  Dektak 150 Surface Profiler_iac

  Advanced thin and thick film step height measurement tool capable of profiling surface topography and waviness, and measuring surface roughness in the nanometer range. This compact system is capable of measuring steps below 10 nm with a step-height repeatability of 0.6 nm. The instrument is equipped with 3D mapping capability allowing to record a surface contour data in three dimensions (X, Y, and Z).
  Sample - solids with a dimension of up to 6 x 6 x 4 inches. Films made of soft material may be difficult to measure using this instrument.

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  Manufacturer: Veeco
  Model Number: Dektak 150
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Surface Science
  

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  Dimension Icon SPM_iac

  Scanning Probe Microscope - SPM - capabile of measuring 3D topography and surface roughness.
  

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  Manufacturer: Veeco
  Model Number: Dimension 3100
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Surface Science
  

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  Kratos AXIS Supra_iac

  Axis Supra system is the state of the art electron spectrometer combining X-ray photoelectron spectroscopy (XPS), micro XPS and imaging XPS. It is equipped with monochromatic X-ray source and dual Al-Mg anode. High collection efficiency and high spatial resolution is provided by a magnetic lens. For low collection angles an electrostatic lens can be used, either independently or in combination with the magnetic lens. Hemispherical analyser - HSA - provides both high energy resolution and high sensitivity for micro spectroscopy with spatial resolution.
  

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  Manufacturer: Kratos Analytical
  Model Number: AXIS Supra
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Surface Science
  

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  Kratos AXIS Ultra DLD (XPS, AES, UPS + SIMS)_iac

  Axis Ultra DLD system is the state of the art electron spectrometer combining X-ray photoelectron spectroscopy (XPS), micro XPS and imaging XPS. The system is equipped with monochromatic X-ray source and dual Al-Mg anode. High collection efficiency and high spatial resolution is provided by a magnetic lens. For low collection angles an electrostatic lens can be used, either independently or in combination with the magnetic lens. Hemispherical analyser - HSA - provides both high energy resolution and high sensitivity for micro spectroscopy with spatial resolution.
  Samples - powders or films  with a dimension of 1.5 X 1.5 cm, (>20 mg), and no oil content.

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  Manufacturer: Kratos Analytical
  Model Number: AXIS Ultra DLD
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Surface Science
  

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  NanoTest_iac

  Mechanical property analysis of surface, covering the following tests a) indentation - measuring hardness and elastic modulus of bulk or thin film samples; b) scanning and scrach - measuring wear resistance; c) impulse/impact - measuring surface structure resistance; d) fretting test indentation - simulating fretting ware on sample surface to test surface cracking resistance.
  Sample - thin films and bulk with smooth surface.

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  Manufacturer: Micro materials
  Model Number: NanoTest Vantage
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Surface Science
  

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  Secondary Ion Mass Spectrometry (SIMS)_iac

  Dynamic SIMS equipment for elemental identification of extreme surface or depth of various devices with a sensitivity down to ppb . This instrument is capable of detecting all elements in periodic table, from hydrogen to uranium, including their corresponding isotopes. It is equipped with oxygen and argon guns that can produce intense and focused ion beams. Oxygen is ideal for the analysis of electropositive elements with the highest sensitivity. Using specific protocols based on reference samples, the quantification of elements present with concentration lower than a few percent (typically from 10-6 – 1 %) can be easily achieved. For elements present with higher concentration (matrix effect regime), the SIMS workstation has the capability to ionizing neutral emitted species using an electron impact source (SNMS) whose generated ions are analyzed using a MAXIM quadrupole spectrometer with an available mass range of up to 510u. The SIMS instrument is also equipped with an oxygen flooding capability to improve the depth resolution (~ 5nm) during depth profiling of specific devices.
  Sample - solid samples only with a maximum dimension of 1 x 1 x 0.5cm.

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  Manufacturer: Kratos/Hiden
  Model Number: Hiden SIMS Workstation
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Surface Science
  

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  Spectroscopic Ellipsometer UVISEL ER FGMS (190 - 2100 nm)_iac

  Spectroscopic Ellipsometer capable of measuring the following properties of a thin film sample with a thickness from 1Å to >45µm*: a) optical constants (n,k) for isotropic, anisotropic, and graded films; b) surface and interface roughness; c) derived optical properties such as absorption coefficient α and optical bandgap including optical constants and film thickness (raw data).
  Sample - thin films.

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  Manufacturer: Horiba Jobin Yvon
  Model Number: UVISEL ER FGMS (190 - 2100 nm)
  Location: Building 3, Level 0 West
  

• Imaging and Characterization Core Lab
  Surface Science
  

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  Spectroscopic Ellipsometer UVISEL LT AGMS (210 - 2100 nm)_iac

  Spectroscopic Ellipsometer capable of measuring the following ​properties of a thin film sample with​ thickness from 1Å to >45µm*: a) optical constants (n,k) for isotropic, anisotropic, and graded films; b) surface and interface roughness; c) ​derived optical properties such as absorption coefficient α and optical bandgap including optical constants and film thickness (raw data).
  Sample - thin films.

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  Manufacturer: Horiba Jobin Yvon
  Model Number: UVISEL LT AGMS (210 2100 nm)
  Location: Building 3, Level 0 West