Keywords
Core Lab
Service Area
Total equipment found: 733
Prototyping and Product Development Core Lab
Central Fabrication Lab
Drop Saw W.F. Wells
Machine Specifications:
Capacity: Rectangular at 90° 17″ High x 20″ Wide,
Round at 90° 17″ Diameter
Weight Capacity: 5,000 lbs
Please check the file Specifications in file tab for more details.
Website:
https://wfwells.com/products/semi-automatic-twin-post/model-f-16-3/
Manufacturer:
W.F.WELLS INC
Model Number:
F-16-3
Location:
Building 4,
Level 0
West
Prototyping and Product Development Core Lab
Harbor Fabrication Lab
Alpha 1460XS CNC Lathe
460mm swing, 11kW spindle motor, 1500mm between centres. Cutting edge design and construction quality. Uses high performance cast iron with Warren-type construction for maximum strength and optimum
swarf clearance.
For more detrails please refer to Datasheet in Files tab
Website: https://www.colchester.co.uk/
Manufacturer:
Colchester Harrison
Model Number:
ALPHA 1460 XS
Location:
Building 27,
Level 2
Imaging and Characterization Core Lab
Surface Science
Surface Profiler - Dektak XT
Advanced thin and thick film step height measurement tool capable of profiling surface topography and waviness, and measuring surface roughness in the nanometer range. This compact system is capable of measuring steps below 10 nm with a step-height repeatability of 0.4 nm. The instrument is equipped with 3D mapping capability allowing to record a surface contour data in three dimensions (X, Y, and Z).
Sample - solids with a dimension of up to 6 x 6 x 4 inches.
Manufacturer:
Bruker
Model Number:
Dektak XT
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Physical Characterization
Probe Station Manual with 4200 SCS
Probe Station Manual with keithley 4200 SCS capable of physically acquiring signals from the contacting pad of a semiconductor device. It utilizes manipulators which allow precise positioning of thin needles on the surface of the device. When being electrically stimulated, signals will be acquired by the probe needles and transferred to a variety of different electronic characterization equipment.
Sample - semiconductor devices, fabricated integrated circuit chips or printed circuit boards.
Manufacturer:
Cascade Microtech
Model Number:
M-150
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Physical Characterization
Bruker D8 Twin
Automatically switch between Bragg-Brantano optics and parallel optics
Manufacturer:
Bruker
Model Number:
D8 Advance A25
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Physical Characterization
Bruker D8 Eiger
IuS microfocus X-ray source with Eiger 2D detector
Manufacturer:
Bruker
Model Number:
D8 Discover A25
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Physical Characterization
Bruker D8 Advance
X-ray Diffractometer - XRD - for phase identification at room temperature.
Sample - powders.
Manufacturer:
Bruker
Model Number:
D8 Advance
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Physical Characterization
Bruker D8 Advance 2
X-ray diffraction for powder sample with non-ambient environment
Manufacturer:
Bruker
Model Number:
D8 Advance
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Physical Characterization
Bruker D8 Venture
X-ray Diffractometer for single crystal structure determination.
Sample - single crystal.
Manufacturer:
Bruker
Model Number:
D8 Venture
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Physical Characterization
Bruker D2 Phaser
X-ray Diffractometer - XRD - for phase identification at room temperature.
Sample - powders.
Manufacturer:
Bruker
Model Number:
D2 Phaser 2 Gen
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Optical Microscopy
Olympus BX43
Upright micrscope for fluorescence, DIC and brightfield epifluorescence imaging.
Sample - standard sample on microscope slide, transparent or non-transparent sample but with fluorescence.
Manufacturer:
Olympus
Model Number:
BX43F
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Optical Microscopy
Nikon SMZ 25
Stereomicroscope offers 25:1 zoom range, bright and high contrast fluorescent images.
Sample - standard sample on microscope slide, transparent or non-transparent sample but with fluorescence.
Manufacturer:
Nikon Instruments Inc.
Model Number:
SMZ25
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Optical Microscopy
Olympus Material Microscope BX61
Epifluorescence imaging with phase contrast.
Sample - on standard microscope slide or wafer.
Manufacturer:
Olympus
Model Number:
U-AFAZM-VIS
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Physical Characterization
4 Point Probe
Thin film resistivity measurement by physically acquiring signals from the contacting pad of a semiconductor device. It utilizes manipulators which allow precise positioning of thin needles on the surface of the device. When electrically stimulated, signals will be acquired by the probe needles and transferred to a variety of different electronic characterization equipment.
Sample - semiconductor devices, fabricated integrated circuit chips, printed circuit boards.
Manufacturer:
Cascade Microtech
Model Number:
SQ-CPS-06-SYS-01
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Optical Microscopy
ZEISS Airyscan Inverted Confocal
The microscope is an inverted confocal microscope system with Airyscan detector
Manufacturer:
Carl Zeiss
Model Number:
Axio Observer.Z1
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Optical Microscopy
Leica SP8 STED system
Confocal microscope with STED and hyvolution function and light sheet module.
Manufacturer:
Leica
Model Number:
TCS SP8
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Surface Science
Spectroscopic Ellipsometer ER FGMS
Spectroscopic Ellipsometer capable of measuring the following properties of a thin film sample with a thickness from 1A to >45um: a) optical constants (n,k) for isotropic, anisotropic, and graded films; b) surface and interface roughness; c) derived optical properties such as absorption coefficient and optical bandgap including optical constants and film thickness (raw data).
Sample - thin films.
Manufacturer:
Horiba Jobin Yvon
Model Number:
Uvisel
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Surface Science
SIMS
Dynamic SIMS equipment for elemental identification of extreme surface or depth of various devices with a sensitivity down to ppb . This instrument is capable of detecting all elements in periodic table, from hydrogen to uranium, including their corresponding isotopes. It is equipped with oxygen and argon guns that can produce intense and focused ion beams. Oxygen is ideal for the analysis of electropositive elements with the highest sensitivity. Using specific protocols based on reference samples, the quantification of elements present with concentration lower than a few percent (typically from 10-6 1 %) can be easily achieved. For elements present with higher concentration (matrix effect regime), the SIMS workstation has the capability to ionizing neutral emitted species using an electron impact source (SNMS) whose generated ions are analyzed using a MAXIM quadrupole spectrometer with an available mass range of up to 510u. The SIMS instrument is also equipped with an oxygen flooding capability to improve the depth resolution (~ 5nm) during depth profiling of specific devices.
Sample - solid samples only with a maximum dimension of 1 x 1 x 0.5cm.
Manufacturer:
Kratos/Hiden
Model Number:
N/A
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Surface Science
Spectroscopic Ellipsometer LT AGMS
Spectroscopic Ellipsometer capable of measuring the following properties of a thin film sample with a thickness from 1A to >45um: a) optical constants (n,k) for isotropic, anisotropic, and graded films; b) surface and interface roughness; c) derived optical properties such as absorption coefficient and optical bandgap including optical constants and film thickness (raw data).
Sample - thin films.
Manufacturer:
Horiba Jobin Yvon
Model Number:
Uvisel
Location:
Building 3,
Level 0
West
Imaging and Characterization Core Lab
Surface Science
XPS Amicus
X-ray Photoelectron Spectroscopy - XPS -capable of analysing the following properties a) elemental composition/quantification (survey spectra); b) chemical composition (low resolution spectra, raw data depth profile). It is equipped with an achromatic X-ray source and dual Al-Mg anode.
Sample - powders or films with a dimension of 0.6 cm X 0.6 cm, weigh >20 mg with no oil content.
Manufacturer:
Kratos Analytical
Model Number:
AMICUS
Location:
Building 3,
Level 0
West
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