Field emission scanning electron microscope capable of producing images of a sample by scanning with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. It is an SEM capable of imaging magnetic nano particles with no image distortion for non-conductives samples such as minerals, ceramics, glass and polymers.
Sample - various types of solid sample.

Nova Nano SEM 630 is a scanning electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. This is field-emission SEM capable of ultra-high resolution characterization at high and low voltage in low and/or high vacuum environment. It is equipped with advanced optics that include a 2-mode final lens (immersion and field-free), SE/BSE in-lens detection, solid state backscatter detectors and beam deceleration technologies. Analytical capabilities are provided by EDS and EBSD from the EDAX. The instrument is also complemented by Quorum's cryo stage and preparation chamber that allows characterization of wet biological and non-biological samples in low temperature.
Sample - variety of materials including biological samples (with or without sample preparations), nano-particles, powders, nano-tubes and -wires, porous materials, plastic, polymers, glass substrates, organic materials and thin films

Large volume imaging with isotropic 3D resolution enabled by a Serial Block-Face SEM (SBF-SEM) and Multi-Energy Deconvolution SEM (MED-SEM).

Transmission electron microscope - TEM - that can perform bright field (BF)/Dark field (DF) imaging of samples and electron diffraction.
Sample - a wide range of sample types with thickness < 200 nm in the electron beam penetrating direction. High resolution imaging of powders and bulks require very thin (50 nm) sample with high contrast at a resolution down to 1 nm.

Transmission electron microscope - TEM - capable of performing BF/DF imaging; Cs corrected high resolution TEM imaging of samples with high contrast; high resolution TEM imaging of samples with high contrast EFTEM imaging; and electron diffraction .
Sample - majority of TEM samples, including solids, nanoparticles, and powders with sample thickness of < 200 nm in the electron beam penetrating direction.

High resolution imaging in cryo condition and of frozen samples.
Sample - a wide range of sample types with thickness between a few nanometer to a micrometer.

Titan Cs Probe is equipped with HR - TEM, HR - STEM, EDX analysis and high energy resolution EELS with monochromator. It is capable of performing BF/DF imaging; Cs probe corrected high resolution STEM imaging of samples with high contrast; high resolution TEM imaging of samples with high contrast EFTEM imaging; fast EELS STEM spectrum imaging; DPC of magnetic samples; monochromated STEM/TEM at high/low accelerating voltages; TEM/STEM tomography of samples; and electron diffraction. Point resolution: 0.08 nm, information limit: 0.1 nm, EFTEM resolution: 1 nm, STEM-resolution: 0.08 nm, electron tomography resolution: 1 nm. Lorentz TEM and Fast EELS STEM spectrum imaging. Magnetic samples can be analyzed (DPC and holography) with this microscope.
Sample - majority of TEM samples including solids, nanoparticles, and powders with thickness of < 200 nm in the electron beam penetrating direction; and magnetic samples

Engraving Area 36" x 24" (914 x 610 mm)
Laser Wattage 50 watts
Laser Source State-of-the-art, digitally controlled, air-cooled CO2 laser tubes are fully modular, permanently aligned and field replaceable.
Air Assist Attach an air compressor to our included Air Assist to remove heat and combustible gases from the cutting surface by directing a constant stream of compressed air across the cutting surface.
Size (W x D x H) 50.5" x 33" x 42" (1283 x 838 x 1067 mm) - (120 watt: 36"/914 mm deep).
Size (W x D x H) 50.5" x 33" x 42" (1283 x 838 x 1067 mm) - (120 watt: 36"/914 mm deep).
Laser System Classification Class 2 Laser Product - 1 mW CW Maximum 600-700 nm.

JET geared head bench lathes feature an enclosed gearbox for smooth, quiet operation. Precision roller bearings support the hardened and ground spindle resulting in tight tolerances. Each JET Lathe comes loaded with features you’ve come to expect, all backed by the industry leading JET Two Year Warranty.
SPECIFICATIONS
Size
13 x 40
Accessories
Stand
Swing Over Bed (In.)
13
Swing Over Cross Slide (In.)
7-25/32
Swing Through Gap (In.)
18-3/4
Length of Gap (In.)
8
Distance Between Centers (In.)
40
Spindle Bore (In.)
1-3/8
Spindle Mount
D1-4
Number of Spindle Speeds
8
Range of Spindle Speeds (RPM)
70 - 2,000
Spindle Taper with Sleeve
MT-5 (MT-3)
Number of Longitudinal and Cross Feed Rates
40
Range of Longitudinal Feeds (IPR)
.0018 - .0374
Range of Cross Feeds (IPR)
.0006 - .0130
Number of Inch Threads
38
Range of Inch Threads (TPI)
3-1/2 - 80
Number of Metric Threads
23
Range of Metric Threads.
45 - 10
Max Tool Size (In.)
5/8 x 5/8
Compound Slide Travel (In.)
2-11/16
Cross Slide Travel (In.)
6-5/16
Carriage Travel (In.)
35
Tailstock Spindle Travel (In.)
3-3/4
Taper in Tailstock Spindle
MT-3
Follow Rest Capacity (In.)
2-3/8
Steady Rest Capacity (In.)
2-3/4
Width of Bed (In.)
7-3/8
Motor (HP)
2 HP, 230V, 1Ph
Prewired (V.)
230
Overall Dimensions (L x W x H) (In.)
79 x 28-1/2 x 30
Drive
Geared Head
Style (Type)Bench - Geared Head
Weight (Lbs.)
1,154

Design almost anything with this powerful design station that comes loaded with many design software packages. (e.g. SolidWorks,Fusion360, Proteus, and others)