Machine Specifications:
Capacity: Rectangular at 90° 17″ High x 20″ Wide,
Round at 90° 17″ Diameter
Weight Capacity: 5,000 lbs
Please check the file Specifications in file tab for more details.
Website:
https://wfwells.com/products/semi-automatic-twin-post/model-f-16-3/

460mm swing, 11kW spindle motor, 1500mm between centres. Cutting edge design and construction quality. Uses high performance cast iron with Warren-type construction for maximum strength and optimum
swarf clearance.
For more detrails please refer to Datasheet in Files tab
Website: https://www.colchester.co.uk/

Advanced thin and thick film step height measurement tool capable of profiling surface topography and waviness, and measuring surface roughness in the nanometer range. This compact system is capable of measuring steps below 10 nm with a step-height repeatability of 0.4 nm. The instrument is equipped with 3D mapping capability allowing to record a surface contour data in three dimensions (X, Y, and Z).
Sample - solids with a dimension of up to 6 x 6 x 4 inches.

Probe Station Manual with keithley 4200 SCS capable of physically acquiring signals from the contacting pad of a semiconductor device. It utilizes manipulators which allow precise positioning of thin needles on the surface of the device. When being electrically stimulated, signals will be acquired by the probe needles and transferred to a variety of different electronic characterization equipment.
Sample - semiconductor devices, fabricated integrated circuit chips or printed circuit boards.

Automatically switch between Bragg-Brantano optics and parallel optics

IuS microfocus X-ray source with Eiger 2D detector

X-ray Diffractometer - XRD - for phase identification at room temperature.
Sample - powders.

X-ray diffraction for powder sample with non-ambient environment

X-ray Diffractometer for single crystal structure determination.
Sample - single crystal.

X-ray Diffractometer - XRD - for phase identification at room temperature.
Sample - powders.

Upright micrscope for fluorescence, DIC and brightfield epifluorescence imaging.
Sample - standard sample on microscope slide, transparent or non-transparent sample but with fluorescence.

Stereomicroscope offers 25:1 zoom range, bright and high contrast fluorescent images.
Sample - standard sample on microscope slide, transparent or non-transparent sample but with fluorescence.

Epifluorescence imaging with phase contrast.
Sample - on standard microscope slide or wafer.

Thin film resistivity measurement by physically acquiring signals from the contacting pad of a semiconductor device. It utilizes manipulators which allow precise positioning of thin needles on the surface of the device. When electrically stimulated, signals will be acquired by the probe needles and transferred to a variety of different electronic characterization equipment.
Sample - semiconductor devices, fabricated integrated circuit chips, printed circuit boards.

The microscope is an inverted confocal microscope system with Airyscan detector

Confocal microscope with STED and hyvolution function and light sheet module.

Spectroscopic Ellipsometer capable of measuring the following properties of a thin film sample with a thickness from 1A to >45um: a) optical constants (n,k) for isotropic, anisotropic, and graded films; b) surface and interface roughness; c) derived optical properties such as absorption coefficient and optical bandgap including optical constants and film thickness (raw data).
Sample - thin films.

Dynamic SIMS equipment for elemental identification of extreme surface or depth of various devices with a sensitivity down to ppb . This instrument is capable of detecting all elements in periodic table, from hydrogen to uranium, including their corresponding isotopes. It is equipped with oxygen and argon guns that can produce intense and focused ion beams. Oxygen is ideal for the analysis of electropositive elements with the highest sensitivity. Using specific protocols based on reference samples, the quantification of elements present with concentration lower than a few percent (typically from 10-6 1 %) can be easily achieved. For elements present with higher concentration (matrix effect regime), the SIMS workstation has the capability to ionizing neutral emitted species using an electron impact source (SNMS) whose generated ions are analyzed using a MAXIM quadrupole spectrometer with an available mass range of up to 510u. The SIMS instrument is also equipped with an oxygen flooding capability to improve the depth resolution (~ 5nm) during depth profiling of specific devices.
Sample - solid samples only with a maximum dimension of 1 x 1 x 0.5cm.

Spectroscopic Ellipsometer capable of measuring the following properties of a thin film sample with a thickness from 1A to >45um: a) optical constants (n,k) for isotropic, anisotropic, and graded films; b) surface and interface roughness; c) derived optical properties such as absorption coefficient and optical bandgap including optical constants and film thickness (raw data).
Sample - thin films.

X-ray Photoelectron Spectroscopy - XPS -capable of analysing the following properties a) elemental composition/quantification (survey spectra); b) chemical composition (low resolution spectra, raw data depth profile). It is equipped with an achromatic X-ray source and dual Al-Mg anode.
Sample - powders or films with a dimension of 0.6 cm X 0.6 cm, weigh >20 mg with no oil content.