FEI Dualbeam system combines SEM and FIB together with the capabilities of SEM image, Milling, Deposition, TEM lamella creation and Micro/nano patterning.
FIB is used as a micro- and nano-machining tool to modify materials at the micro and nanoscale. It can also be used to deposit material such as platinum, carbon or gold via ion beam induced deposition. The FIB is commonly used to prepare very thin samples (typically ~100 nanometers) for the transmission electron microscope.
a) Resolution at optimum distance: 5nm @30KV high throughput and high resolution S/TEM sample preparation - High-resolution SEM imaging and energy dispersive X-ray analysis (EDS)
b) Resolution at optimum distance: 0.9nm@15KV,1.4nm@1KV - Flipstage and insitu STEM detector for STEM imaging
c) Resolution at optimum distance: 0.8nm@30KV STEM - GIS system of deposition and enhanced milling for patterning.
Sample - conductive solid materials.

​The Helios G4 is a SEM with FIB capabilities. FIB is used to modify or machine materials at the micro and nanoscale; and to deposit material such as platinum, carbon, gold, etc. via ion beam induced deposition.
The FIB is also commonly used to prepare very thin samples (typically ~100 nanometers) for the transmission electron microscope.
The Helios G4 is equipped with a cryo stage that allows examination of specimens at very low temperature (-180 deg.C).​​​

Scanning electron microscope - SEM - that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. This is is an ultra-high resolution field emission SEM with UniColor (UC) technology, 2-mode final lens (immersion and field-free), SE/BSE in-lens detection, a solid state concentric backscatter (CBS) detector and beam deceleration capability. Combined, these features help maximize resolution, surface detail and contrast at very low voltages. The EDS attachment allows for elemental identification/localization.
Sample - conductive, semi-conductive and poorly conductive materials in the form of bulk, powders and thin films. These include nano-particles, nano-tubes and -wires, porous materials, plastics, polymers, glass substrates, and organic and inorganic materials.

Measures specific surface area (BET), pore volume, and very accurate pore size distribution, of ultamicroporous (0.35 - 0.7 nm, with high precision and high resolution), (microporous (0.7nm - 2nm), mesoporous (2nm - 50nm) and low surface area materials by probing the activated surface of the sample with gases such as Nitrogen, Argon, CO2 or others and measuring the adsorbed gas volume at fixed bath temperature (i.e. liquid nitrogen, liquid argon, ice bath) and increasing static pressure ranging from 0.001 umHg up to 760 mmHg. The relative pressure data start in the range of 10^-09 p/p0 where ultramicropores start filling.
Vapor adsorption option is also available for saturated, unsaturated hydrocarbons, and aromatic rings. Other kinds of vapors need to be discussed with lab scientists.
Samples - solids, powders or polymers. Quantity to be discussed with lab scientists.

The DENS Gas System Supply is an equipment consisting of a TEM sample holder and a gas supply system. The sample holder contains a nano-reactor were three different gases can be injected to perform in-situ TEM experiments. The gas supply system can tune precisely the flow (max 50 ml/min), mixture and partial pressure of the gases. The maximum total pressure that can be reached in the nano-reactor is 1 bar. A safety system avoids any further rise of pressure by deviating the excess of gas into the exhaust line.

NMR spectrometer dedicated to solid-state dynamic nuclear polarization (DNP) NMR applications at low temperature. This instrument is equipped with a Double Resonance LT MAS probe for solid-state DNP-NMR having 3.2 mm MAS system, 30 L sample volume, maximum of 24 kHz (RT) or 12 kHz (LT) and is optimized for X-observation with 1H high-power decoupling. The tuning range can be extended by exchanging inserts. It is also equipped with a Triple Resonance H/X/Y LT MAS probe for solid-state DNP-NMR having 3.2 mm MAS system, 30 L sample volume, maximum of 24 kHz (RT) or 12 kHz (LT) spinning speed, and optimized for various X nuclei observation with 1H high-power decoupling.
Sample - solid fine powders, possible to impregnate and not reacting with radicals.

NMR spectrometer dedicated to solution-state biomolecular NMR applications. It is equipped with a triple resonance inverse 1H-13C-15N 5 mm TCI cryoprobe offering the highest sensitivity for 1H-detected NMR applications. An additional probe includes a 5 mm TXI probe for 1H-13C-15N experiments.
Sample - solution-state of low to high concentration, normal liquid viscosity, normal sample volume.

This instrument is dedicated for studying chemical systems having unpaired electrons. The pulsed/CW electron-spin resonance spectrometer system at X-band has ELDOR and ENDOR accessories. The system is equipped with three resonators such as the standard resonator, cylindrical resonator for aqueous samples, and ENDOR resonator. The system is capable of low temperature experiments using liquid Helium and liquid Nitrogen. It is also equipped with UV irradiation system with chopper and light filters; cooling side plates for 600 K temperature experiments; SOFT X-Sophie CW simulation package; goniometer for crystal rotation capability.

Electron Paramagnetic Resonance - EPR - is dedicated to study chemical systems having unpaired electrons. The electron-spin resonance spectrometer system is equipped with a standard resonator for high sensitivity continuous wave electron paramagnetic resonance (CW-EPR) in X-Band both for solutions and solid-state sample applications. It has an optical window for light access, a sample access of 10 mm maximum, modulation amplitude of 20 G maximum at 100 kHz and automatic iris control. It is used as an analytical tool to investigate free radical complexes, paramagnetic complex and proteins. The spectrometer is able to perform standard identification studies.
Sample - solid state and solution state that contain unpaired electron.

Imaris Image analysis/processing. Fiji image analysis. Amira 3D visualization.

This 400 MHz NMR spectrometer is dedicated to solid-state NMR applications. This instrument is equipped with a 4 mm H/X (X=15N-31P) CP-MAS probe with spinning speed capability of up to 15 kHz and variable temperature range from -120 to +150 deg.C; a 3.2 mm triple resonance X/Y/H (X=13C, Y=15N to 2H) CP-MAS probe with spinning speed capability up to 24 kHz; and a 7 mm double resonance H/X (X=15N-31P) CPMAS probe capable of spinning speed of 7 kHz with a variable temperature range of -120 to +150 deg.C.
Sample - powders, crystalline or amorphous materials.

This 400 MHz NMR spectrometer is dedicated for solid NMR applications. This instrument is equipped with a 3.2 mm triple resonance X/Y/H (X=13C, Y=15N to 2H) CP-MAS probe capable of spinning speed of 24 kHz; and a 4 mm triple resonance X/Y/H (15N-31P/15N-2H/1H) CPMAS probe capable of spinning speed of 15 kHz. Both probes have a variable temperature range of -140 to +150 deg. C.
Sample - powders, crystalline or amorphous materials.

SWB magnetic resonance imaging - MRI - equipped with a Mini Imaging Quadrature 1H probehead using a birdcage coil.
Sample - material with up to 6cm diameter to fit the sample container.

This 500 MHz NMR spectrometer is dedicated for solution-state NMR applications. The default probe is a 5mm BBFO Broadbanded observe Cryoprobe with highest sensitivity on the broadest range of nuclei in the range of 31P to 15N (excluding between 199Hg and 153Eu). It is also equipped with a 5 mm triple inverse TCI H-C/N-D-05-Z cryoprobe for highest sensitivity for proton inverse spectroscopy, and superior sensitivity for 13C; 15N direct detection not recommended. This instrument is also equipped with a 5 mm inverse triple resonance 1H/13C/15N TXI probe.
Sample - solution-state of low to high concentration, normal liquid viscosity, normal sample volume. For custom service, protein samples or other samples requiring proper calibrations.

NMR spectrometer system dedicated to solid-state NMR applications. This instrument is equipped with cross polarization magic angle spinning (CPMAS) probes: a 3.2 CP-MAS X/Y/H (13C/15N-2H/1H) triple resonance probe capable of spinning speed up to 24 kHz; a 4mm CPMAS X/Y/H (low-gamma) with specialized inserts; two 2.5 mm 1H/19F/X (one with X=N-C) and (one with X=N-P) triple resonance CP-MAS probe capable of spinning speed up to 35 kHz. These probes have variable temperature range of -140 to +150 deg.C. This instrument is also equipped with a 4 mm high temperature H/X (X=15N-31P) CP-MAS probe with spinning speed capability of up to 15 kHz and variable temperature range from -120 to +300 deg.C, and a MASCAT high temperature in-situ NMR probe with a temperature limit of 400 deg C. It is also equipped with a 4 mm high-resolution-MAS (HR-MAS) 1H/13C dual inverse probe.
Sample - powders, crystalline or amorphous materials, and inhomogeneous solution samples.

NMR spectrometer system dedicated to broadband solution-state NMR applications, and variable temperature NMR operation.
The default probe is a 5 mm Z-gradient SmartProbe BB(F)-H-D for observation of 19F with 1H decoupling; and capable of observation of nuclei in the range 15N to 31P with 1H decoupling, and a variable temperature range of -150 to +150 deg. This instrument is also equipped with a 5 mm Z-gradient broadband probehead BBO capable of observation of nuclei in the range 109Ag to 31P with 1H decoupling, and a variable temperature range of -150 to +180 deg. C. This instrument is also equipped with a backup 5 mm triple inverse TCI H-C/N-D-05-Z cryoprobe and 10 mm high temperature DCH cryoprobe capable of a VT limit of 135 deg.C, and a BACS-60 sample changer. Lastly, this instrument is also equipped with a Diff-30 diffusion probe and gradient accessory.
Sample - solution-state of low to high concentration, normal liquid viscosity, and normal sample volume.

NMR spectrometer system dedicated to solid state NMR experiments. The magnet is equipped with 6 different CPMAS probes. It is equipped with a CPMAS triple resonance high speed 1.3mm probe with a tuning range of 15N-13 deg.C on X/Y plus 1H capable of a sample temperature of -70 to +80 deg.C. The default probe is a CPMAS triple resonance 3.2mm probe, maximum spinning speed of 24kHz, with one H/C/N insert for applications with 1H decoupling only, and a variable temperature range of -140 to +150 deg.C.; a 3.2mm H/F-X (X=15N-31P) CPMAS probe, maximum spinning speed of 24 kHz; a 4.0 mm low-gamma H/X (X=13C, 15N-32.8 MHz) probe for low frequency nuclei, maximum spinning speed of 15 kHz; a 2.5mm H/X/Y CPMAS probe with exchangeable inserts for X and Y and 35 KHz maximum spinning speed; and a 3.2mm 13C/15/1H E-free CPMAS probe with maximum spinning speed of 24 kHz and a temperature range of -80 to +80 deg.C.
Sample - powders, and crystalline or amorphous materials.

NMR spectrometer system dedicated to solution-state NMR applications. The default probe is a 5 mm triple resonance inverse TCI H-C/N-D cryoprobe with ATM & Z-gradient. The magnet is equipped with a 5 mm Quadrupole Inverse or QXI for 1H/31P/13C/15N observation capable of VT operation from -150 to +180 deg.C and automatic tuning and matching; and with a high throughput sample changer for up to 5x96 tubes.
Sample - solution-state of low to high concentration, normal liquid viscosity, normal sample volume, protein samples, or samples requiring accurate or proper calibrations.

Titan Themis Z is equipped with HR - TEM, HR - STEM, EDX analysis and high energy resolution EELS with monochromator.

Titan ST is equipped with HR - TEM, HR - STEM, EDX and EELS. It is capable of performing BF/DF imaging; high resolution imaging of samples with high contrast; EFTEM imaging; TEM/STEM tomography; and electron diffraction. Point resolution: 0.24 nm, information limit: 0.12 nm, EFTEM resolution: 1 nm, STEM-resolution: 0.17 nm, electron tomography resolution: 1 nm.
Sample - a wide range of sample types including solids, nanoparticles and powders with sample thickness < 500 nm in the electron beam penetrating direction.